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Volumn 9, Issue 2, 2002, Pages 86-89

New opportunities in trace elements structural characterization: High-energy X-ray absorption near-edge structure spectroscopy

Author keywords

High energy; Trace elements; XAS

Indexed keywords


EID: 0036521354     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049502002327     Document Type: Article
Times cited : (2)

References (19)
  • 14


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.