SCOPUS 정보 검색 플랫폼

Volumn 29, Issue 3, 2002, Pages 236-238

Method of evaluating the roughness of a Co/C multi-layer film

Author keywords

Interface roughness; Multi layer mirror; Reflectance

Indexed keywords

MATHEMATICAL MODELS; MULTILAYERS; REFLECTION; SURFACE ROUGHNESS; X RAYS;

INTERFACE ROUGHNESS; MULTILAYER MIRROR; X RAY SHORT WAVELENGTH REGION;

MIRRORS;

EID: 0036519682 PISSN: 02587025 EISSN: None Source Type: Journal
DOI: None Document Type: Article

Times cited : (2)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.