Method for evaluating partial response maximum likelihood system performance using sequenced amplitude margin

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 41, Issue 3 B, 2002, Pages 1783-1784

  Okumura, Tetsuya ^a   Numata, Tomiyuki ^a   Akiyama, Jun ^a   Maeda, Shigemi ^a   Yamaguchi, Takeshi ^a   Takahashi, Akira ^a  

^a SHARP CORPORATION   (Japan)

Author keywords

Bit error rate; Optical disk; Partial response maximum likelihood; Sequenced amplitude margin

Indexed keywords

BIT ERROR RATE; MAGNETOOPTICAL EFFECTS; MAXIMUM LIKELIHOOD ESTIMATION;

SEQUENCED AMPLITUDE MARGIN (SAM);

OPTICAL DISK STORAGE;

EID: 0036508718     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.41.1783     Document Type: Conference Paper

References (2)