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Volumn 41, Issue 3 A, 2002, Pages 1235-1240

Growth and characterization of anodic oxidized films in pure water

Author keywords

Anodic oxidation; Low temperature process; Silicon dioxide; Thermal annealing

Indexed keywords

ANNEALING; ANODIC OXIDATION; DEPOSITION; ETCHING; SILICA; SURFACE ROUGHNESS; WATER;

EID: 0036508690     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.41.1235     Document Type: Article
Times cited : (13)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.