Improved reliability-prediction and field-reliability-data analysis for field-replaceable units

IEEE Transactions on Reliability

Volumn 51, Issue 1, 2002, Pages 8-16

  Jackson, Donald S ^b   Pant, Himanshu ^a,c   Tortorella, Michael ^c  

^a IEEE

^b NOKIA RESEARCH CENTER   (United States)

^c LUCENT TECHNOLOGIES   (United States)

Author keywords

Age specific failure rate; Field replaceable unit; Reliability prediction

Indexed keywords

FAILURE ANALYSIS; FORECASTING; STATISTICAL METHODS; SYSTEMS ANALYSIS;

FIELD-RELIABILITY-DATA ANALYSIS; FIELD-REPLACEABLE UNITS; RELIABILITY-PREDICTION;

RELIABILITY;

EID: 0036507950     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/24.994896     Document Type: Article

References (8)

1. A new process grading reliability model
2. Design for reliability: Megatrends to look out for
3. Dealing with real field reliability data: Circumventing incompleteness by modeling and iteration