Intrinsic Josephson junctions in BiSrCaCuO-2212: Recent progress

IEICE Transactions on Electronics

Volumn E85-C, Issue 3, 2002, Pages 691-695

  Wang, Huabing ^a   Chen, Jian ^b   You, Lixing ^a   Wu, Peiheng ^a   Yamashita, Tsutomu ^a  

^a TOHOKU UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

Double side process; Intrinsic Josephson effects; Terahertz response; Zero crossing steps

Indexed keywords

BISMUTH COMPOUNDS; DEGRADATION; ENERGY GAP; JOSEPHSON JUNCTION DEVICES; PHOTOLITHOGRAPHY; SINGLE CRYSTALS;

BISMUTH STRONTIUM CALCIUM COPPER OXIDE; INTRINSIC JOSEPHSON JUNCTIONS; ZERO CROSSING STEPS;

OXIDE SUPERCONDUCTORS;

EID: 0036504625     PISSN: 09168524     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (19)

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