A percolative model of soft breakdown in ultrathin oxides

Physica B: Condensed Matter

Volumn 314, Issue 1-4, 2002, Pages 400-403

  Pennetta, C ^a   Reggiani, L ^a   Trefan Gy ^b  

^a INFM   (Italy)

^b EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

Breakdown; Dielectrics; Monte Carlo; Percolation

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC BREAKDOWN; LEAKAGE CURRENTS; MATHEMATICAL MODELS; MONTE CARLO METHODS; RESISTORS; SPURIOUS SIGNAL NOISE;

ULTRATHIN OXIDES;

ULTRATHIN FILMS;

EID: 0036503530     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(01)01408-9     Document Type: Conference Paper

References (6)