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Volumn 312-313, Issue , 2002, Pages 673-674
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Direct experimental verification of applicability of single-site model for angle integrated photoemission of small TK concentrated Ce compounds
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Author keywords
Ce compounds; Photoemission
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Indexed keywords
ELECTRON ENERGY LEVELS;
ELECTRON RESONANCE;
ELECTRONIC STRUCTURE;
PHOTOEMISSION;
PHOTONS;
POLYCRYSTALLINE MATERIALS;
SPECTROSCOPIC ANALYSIS;
X RAY DIFFRACTION ANALYSIS;
KONDO RESONANCE (KR);
CERIUM COMPOUNDS;
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EID: 0036503361
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/S0921-4526(01)01202-9 Document Type: Conference Paper |
Times cited : (3)
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References (10)
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