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Volumn 74, Issue 2, 2002, Pages 143-149

Double-exposure holographic interferometry technique used for characterization of electrodeposited cobalt oxide thin films

Author keywords

Cobalt oxide; Electrodeposition; Holographic interferometry; Optical absorption; X ray diffraction

Indexed keywords

ELECTRODEPOSITION; HOLOGRAPHIC INTERFEROMETRY; LIGHT ABSORPTION; STAINLESS STEEL; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 0036497820     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0254-0584(01)00470-9     Document Type: Article
Times cited : (15)

References (19)
  • 9
    • 0007961903 scopus 로고    scopus 로고
    • Ph.D. Thesis, Shivaji University, Kolhapur
    • (2000)
    • Kadam, L.D.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.