Synthesis and characterisation of cadmium titanium oxide thin films by sol-gel technique

Journal of Physics and Chemistry of Solids

Volumn 63, Issue 3, 2002, Pages 383-392

  Phani, A R ^a,b   Passacantando, M ^a,b   Santucci, S ^a,b  

^a UNIVERSITY OF L'AQUILA   (Italy)

^b University of New Hampshire   (United States)

Author keywords

C. X ray diffraction

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CRYSTAL MICROSTRUCTURE; FILM GROWTH; INTERFACES (MATERIALS); SCANNING ELECTRON MICROSCOPY; SILICON; SOL-GELS; STOICHIOMETRY; SYNTHESIS (CHEMICAL); TITANIUM OXIDES; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

GRAZING INCIDENCE X-RAY DIFFRACTION (GIXRD);

THIN FILMS;

EID: 0036497401     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3697(01)00025-7     Document Type: Article

References (18)