AFM and XRD investigation of the effect of dissolved oxygen in electrolytes on electrodeposition of CdTe on HgCdTe

Semiconductor Science and Technology

Volumn 17, Issue 3, 2002, Pages 266-269

  Choi, Jong Hwa ^a   Lee, Hee Chul ^a  

^a Korea Advanced Institute of Science and Technology (KAIST)   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DISSOLUTION; ELECTRODEPOSITION; HYDROGEN PEROXIDE; OXYGEN; REDUCTION; SURFACE ROUGHNESS; X RAY DIFFRACTION ANALYSIS;

MERCURY CADMIUM TELLURIDE WAFER; POTENTIOSTATIC DEPOSITION;

SEMICONDUCTING CADMIUM TELLURIDE;

EID: 0036496906     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/17/3/315     Document Type: Article

References (10)