Studies of electronic component fault diagnosis based on the fault trees analysis and virtual instruments

Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument

Volumn 23, Issue 1, 2002, Pages 16-

  Zhu, Daqi ^a   Yu, Shenglin ^a   Chen, Xiaoping ^a  

^a NONE

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EID: 0036485306     PISSN: 02543087     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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