Dislocation microstructure and internal-stress measurements by convergent-beam electron diffraction on creep-deformed Cu and Al

Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

Volumn 33, Issue 2, 2002, Pages 311-317

  Kassner, M E ^a,b   Perez Prado M T ^b,c   Long, M ^a,d   Vecchio, K S ^a  

^a Oregon State University   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c DEPARTMENT OF PHYSICAL METALLURGY   (Spain)

^d HEWLETT PACKARD COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON DIFFRACTION; GRAIN BOUNDARIES; LATTICE CONSTANTS; POLYCRYSTALS; SINGLE CRYSTALS; X RAY DIFFRACTION ANALYSIS;

SUBGRAIN BOUNDARIES;

CREEP TESTING;

EID: 0036475832     PISSN: 10735623     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11661-002-0092-7     Document Type: Article

References (38)

1. Internal Stress and Fatigue in Metals