Simple technique for measuring source reflection coefficient while characterizing active devices

IEEE Transactions on Microwave Theory and Techniques

Volumn 50, Issue 2, 2002, Pages 564-569

  Madonna, GianLuigi ^a,b   Ferrero, Andrea ^a,c  

^a IEEE   (Germany)

^b INFINEON TECHNOLOGIES AG   (Germany)

^c POLITECNICO DI TORINO   (Italy)

Author keywords

Active device characterization; Error box; Microwave measurements; Network analyzer calibration; Source impedance; Source reflection coefficient; Source pull

Indexed keywords

ACTIVE DEVICES;

ELECTRIC IMPEDANCE; HIGH ELECTRON MOBILITY TRANSISTORS; MICROWAVE MEASUREMENT; REFLECTION; REFLECTOMETERS; SPURIOUS SIGNAL NOISE;

MICROWAVE DEVICES;

EID: 0036474412     PISSN: 00189480     EISSN: None     Source Type: Journal    
DOI: 10.1109/22.982236     Document Type: Article

References (10)

1. A novel computerized multiharmonic active load-pull system for the optimization of high efficiency operating classes in power transistors
2. Active load technique for load-pull characterization at microwave frequencies
3. Improvements to on-wafer noise parameter measurements
4. Source-pull measurements using reverse six-port reflectometers with application to MESFET mixer design
5. Automated characterization of HF power transistor by source-pull and multiharmonic load-pull measurements based on six-port techniques
6. Testing microwave devices under different source impedances: A novel technique for on-line measurement of source and device reflection coefficients
7. A generalized theory and new calibration procedures for network analyzer self-calibration
8. Accurate on-wafer power and harmonic measurements of mm-wave amplifiers and devices
9. Measurements of time-domain voltage/current wave-forms at RF and microwave frequencies based on the use of a vector network analyzer for characterization of nonlinear devices - Application to high-efficiency power amplifiers and frequency-multipliers optimization
10. An improved calibration technique for on-wafer large-signal transistor characterization