A new method of scattering-angle scanning for optical beating light scattering spectroscopy

Review of Scientific Instruments

Volumn 73, Issue 2 I, 2002, Pages 263-

  Sonehara, Tsuyoshi ^a   Tanaka, Hajime ^a  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

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EID: 0036473509     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1433948     Document Type: Article

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