Effects of aperture displacement in broad-beam ion extraction systems

Review of Scientific Instruments

Volumn 73, Issue 2 II, 2002, Pages 928-

  Tartz, M ^a   Hartmann, E ^a   Deltschew, R ^a   Neumann, H ^a  

^a LEIBNIZ INSTITUTE OF SURFACE ENGINEERING IOM   (Germany)

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EID: 0036473217     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1428785     Document Type: Conference Paper

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