Multiply charged ion-induced secondary electron emission from metals relevant for laser ion source beam diagnostics

Review of Scientific Instruments

Volumn 73, Issue 2 II, 2002, Pages 776-

  Laska L ^a   Krasa J ^a   Stockli M P ^b   Fehrenbach, C W ^b  

^a INSTITUTE OF PHYSICS   (Czech Republic)

^b KANSAS STATE UNIVERSITY   (United States)

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EID: 0036473133     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1431704     Document Type: Conference Paper

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