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Volumn 73, Issue 2 II, 2002, Pages 846-
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Test of negative ion beams from a microwave ion source with a charge exchange canal for accelerator mass spectrometry applications
a a a a b |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0036472649
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1430517 Document Type: Conference Paper |
Times cited : (13)
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References (0)
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