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Volumn 29, Issue 4, 2002, Pages 521-525

X-ray characterization of indium during melting

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL LATTICES; MELTING; TEXTURES; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

EID: 0036472473     PISSN: 02731177     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0273-1177(01)00650-0     Document Type: Article
Times cited : (10)

References (6)
  • 2
    • 33845930052 scopus 로고
    • Diffuse scattering from defect cluster near bragg reflections
    • (1971) Phys. Rev. B , vol.4 , Issue.4 , pp. 1041
    • Dederichs, H.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.