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Surface and Interface Analysis

Volumn 33, Issue 2, 2002, Pages 122-125

Direct detection of mutation sites on stretched DNA by atomic force microscopy

(5) Zhang, Yi a Lu, Yongtao a Hu, Jun a Kong, Xiangyin a Minqian Li, M L a

a INSTITUTE OF GEOLOGY AND GEOPHYSICS (China)

Author keywords

Atomic force microscopy (AFM); Heteroduplex DNA; Molecular manipulation; Mutation detection; MutS protein

Indexed keywords

ATOMIC FORCE MICROSCOPY; MOLECULAR STRUCTURE; MOLECULES; MUTAGENESIS; PROTEINS;

BINDING RATIO; DNA ALTERATION; DNA STRETCHING; HETERODUPLEX DNA; MOLECULAR MANIPULATION; MUTATION SITE; PROTEIN RECOGNITION;

DNA;

EID: 0036472304 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.1175 Document Type: Article

Times cited : (10)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.