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Volumn 33, Issue 2, 2002, Pages 155-158
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Investigation of the electrostatic forces in scanning probe microscopy at low bias voltages
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Author keywords
AFM; EFM; Scanning probe microscopy; STM
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELECTRIC POTENTIAL;
ELECTROSTATICS;
GRAPHITE;
LASER BEAMS;
MATHEMATICAL MODELS;
CONDUCTING LIQUID COLUMN;
CONFOCAL HYPERBOLOIDS OF REVOLUTION;
ELECTROSTATIC FORCE MICROSCOPY;
LOW BIAS VOLTAGE;
SCANNING PROBE MICROSCOPY;
SCANNING TUNNELING MICROSCOPY;
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EID: 0036470972
PISSN: 01422421
EISSN: None
Source Type: Journal
DOI: 10.1002/sia.1180 Document Type: Article |
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Times cited : (19)
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References (15)
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