Highly ordered anisotropic nano-needles in para-sexiphenyl films

Thin Solid Films

Volumn 403-404, Issue , 2002, Pages 444-448

  Andreev, A ^a   Sitter, H ^a   Sariciftci, N S ^a   Brabec, C J ^a   Springholz, G ^a   Hinterdorfer, P ^a   Plank, H ^b   Resel, R ^b   Thierry, A ^c   Lotz, B ^c  

^a JOHANNES KEPLER UNIVERSITY LINZ   (Austria)

^b GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^c INSTITUT CHARLES SADRON   (France)

Author keywords

Atomic force microscopy; Epitaxy; Oligomers; Single crystalline thin films

Indexed keywords

ANISOTROPY; ATOMIC FORCE MICROSCOPY; CRYSTALLOGRAPHY; GROWTH (MATERIALS); MICA; NANOSTRUCTURED MATERIALS; SEMICONDUCTING ORGANIC COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

PARA-SEXIPHENYL FILMS;

THIN FILMS;

EID: 0036467735     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(01)01587-5     Document Type: Conference Paper

References (11)