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Volumn 498, Issue 1-2, 2002, Pages 116-122

Angle-resolved ultraviolet photoelectron spectroscopy study on the α-Si(1 1 1)√3 × √3-Bi surface

(5) Kim, Y K a Kim, J S a Hwang, C C a Shrestha, S P a Park, C Y a

a Institute for Basic Science (South Korea)

Author keywords

Bismuth; Low energy electron diffraction (LEED); Photoelectron spectroscopy; Silicon; Surface structure, morphology, roughness, and topography

Indexed keywords

BISMUTH; ELECTRONIC STRUCTURE; FERMI LEVEL; LOW ENERGY ELECTRON DIFFRACTION; MORPHOLOGY; PHOTOELECTRON SPECTROSCOPY; SEMICONDUCTING SILICON; ULTRAVIOLET SPECTROSCOPY;

ANGLE-RESOLVED ULTRAVIOLET PHOTOELECTRON SPECTROSCOPY;

SURFACE ROUGHNESS;

EID: 0036467488 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(01)01499-6 Document Type: Article

Times cited : (7)

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