메뉴 건너뛰기




Volumn 34, Issue 1, 2002, Pages 93-96

Direct measurement on transparent plates by using Fizeau interferometry

Author keywords

External cavity diode laser; Fizeau interferometer; Refractive index; Wedge angle

Indexed keywords

AMPLITUDE MODULATION; HELIUM NEON LASERS; IMAGE SENSORS; LASER OPTICS; OPTICAL RESOLVING POWER; PHASE SHIFT; REFRACTIVE INDEX; SEMICONDUCTOR LASERS;

EID: 0036467223     PISSN: 00303992     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0030-3992(01)00085-8     Document Type: Article
Times cited : (30)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.