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Volumn 34, Issue 1, 2002, Pages 93-96
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Direct measurement on transparent plates by using Fizeau interferometry
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Author keywords
External cavity diode laser; Fizeau interferometer; Refractive index; Wedge angle
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Indexed keywords
AMPLITUDE MODULATION;
HELIUM NEON LASERS;
IMAGE SENSORS;
LASER OPTICS;
OPTICAL RESOLVING POWER;
PHASE SHIFT;
REFRACTIVE INDEX;
SEMICONDUCTOR LASERS;
FIZEAU INTERFEROMETRY;
INTERFEROMETRY;
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EID: 0036467223
PISSN: 00303992
EISSN: None
Source Type: Journal
DOI: 10.1016/S0030-3992(01)00085-8 Document Type: Article |
Times cited : (30)
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References (8)
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