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Volumn 10, Issue 2, 2002, Pages 171-175

A new experimental technique to investigate the α2/γ interface of lamellar TiAl alloy three dimensionally

Author keywords

A. Intermetallics; D. Phase interfaces; F. Electron microscopy, transmission; F. Scanning tunneling electron microscopy including atomic force microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; DEFORMATION; DISLOCATIONS (CRYSTALS); GRAIN BOUNDARIES; INTERMETALLICS; PHASE INTERFACES; SCANNING ELECTRON MICROSCOPY; SCANNING TUNNELING MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0036466813     PISSN: 09669795     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0966-9795(01)00120-0     Document Type: Article
Times cited : (6)

References (19)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.