Formation of tetrahedral islands in epitaxial NiO layers deposited on MgO(1 1 1)

Journal of Crystal Growth

Volumn 234, Issue 4, 2002, Pages 704-710

  Warot, B ^a   Snoeck, E ^a   Baules P ^a   Ousset, J C ^a   Casanove, M J ^a   Dubourg, S ^b   Bobo, J F ^b  

^a CEMES CNRS   (France)

^b INSA   (France)

Author keywords

A1. Surface structure; A1. Transmission electron microscopy; A3. RF sputtering; B1. Oxides; B2. Magnetic materials.

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; DEPOSITION; INTERFACIAL ENERGY; MAGNESIA; NICKEL COMPOUNDS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SPUTTERING; SUBSTRATES; SURFACE STRUCTURE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

MAGNETORESISTIVE MAGNETIC HEADS;

EPITAXIAL GROWTH;

EID: 0036466701     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(01)01767-5     Document Type: Article

References (23)