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Volumn 234, Issue 4, 2002, Pages 666-678
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Preparation and structural analysis of Fe2+xTi1-x thin films in the C14 Laves phase stability range
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Author keywords
A3. Molecular beam epitaxy; B2. Magnetic materials
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Indexed keywords
FILM PREPARATION;
IRON COMPOUNDS;
MAGNETIC MATERIALS;
MOLECULAR BEAM EPITAXY;
REFLECTION HIGH ENERGY ELECTRON DIFFRACTION;
SCANNING TUNNELING MICROSCOPY;
SURFACE ROUGHNESS;
X RAY DIFFRACTION ANALYSIS;
LAVES PHASE STABILITY;
X-RAY REFLECTROMETRY;
THIN FILMS;
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EID: 0036466668
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(01)01718-3 Document Type: Article |
Times cited : (4)
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References (29)
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