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Journal of Magnetism and Magnetic Materials

Volumn 239, Issue 1-3, 2002, Pages 220-223

Magnetization measurements on the nanometer-scale

(4) Wassermann, E F a Burgel Chr a Carl, A a Lohau, J b

a UNIVERSITY OF DUISBURG ESSEN (Germany)

b IBM ALMADEN RESEARCH CENTER (United States)

Author keywords

Magnetic dots; Magnetic force microscopy; Magnetic nanostructures

Indexed keywords

COERCIVE FORCE; ELECTRON BEAM LITHOGRAPHY; MAGNETIC ANISOTROPY; MAGNETIC FIELDS; MAGNETIC HYSTERESIS; MAGNETIC MOMENTS; MAGNETIZATION; MAGNETOMETERS; NANOSTRUCTURED MATERIALS; SQUIDS;

MAGNETIC DOTS; MAGNETIC FORCE MICROSCOPY (MFM);

MAGNETIC MATERIALS;

EID: 0036465314 PISSN: 03048853 EISSN: None Source Type: Journal
DOI: 10.1016/S0304-8853(01)00529-7 Document Type: Article

Times cited : (5)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.