Structure and magnetic properties of (Fe97Al3)100-xNx films and (Fe97Al3)85N15/Al2O3 multilayers

Journal of Magnetism and Magnetic Materials

Volumn 240, Issue 1-3, 2002, Pages 448-450

  Stobiecki, T ^a   Kopcewicz, M ^b   Powronik, W ^a   Kusior, E ^a   Winiowski, P ^a   Maass, W ^c   Ocker, B ^c   Rohrmann, H ^c  

^a AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

^b ukasiewicz Research Network Institute of Microelectronics and Photonics   (Poland)

^c Unaxis Deutschland GmbH   (Germany)

Author keywords

CEMS; Multilayers; Phase analysis; Thin films recording heads

Indexed keywords

ALUMINA; ANISOTROPY; IRON COMPOUNDS; MOSSBAUER SPECTROSCOPY; MULTILAYERS; SPUTTERING; X RAY DIFFRACTION ANALYSIS;

CONVERSION ELECTRON MOSSBAUER SPECTROSCOPY (CEMS);

MAGNETIC THIN FILMS;

EID: 0036465098     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(01)00903-9     Document Type: Article

References (5)

1. Computer program