Method of the reflections function in the X-ray reflectometry study of multilayers

Journal of Magnetism and Magnetic Materials

Volumn 240, Issue 1-3, 2002, Pages 494-496

  Kourtina, N V ^a   Kravtsov, E A ^a   Ustinov, V V ^a  

^a INSTITUTE OF METAL PHYSICS   (Russian Federation)

Author keywords

Interface structure; Multilayers, metallic; X ray reflectivity

Indexed keywords

APPROXIMATION THEORY; ELECTRIC FIELD EFFECTS; REFLECTION; SUPERLATTICES; X RAY ANALYSIS;

X-RAY REFLECTOMETRY;

MULTILAYERS;

EID: 0036465036     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(01)00911-8     Document Type: Article

References (6)