Theoretical study of the relation between interfacial imperfection and transport properties in magnetic tunnel junctions

Journal of Magnetism and Magnetic Materials

Volumn 240, Issue 1-3, 2002, Pages 114-116

  Stoeffler, Daniel ^a  

^a INSTITUT DE PHYSIQUE ET CHIMIE DES MATÉRIAUX DE STRASBOURG   (France)

Author keywords

Electronic structure; Interface effects; Thin films multilayer; Tunneling

Indexed keywords

ELECTRONIC STRUCTURE; FERMI LEVEL; INTERFACES (MATERIALS); MULTILAYERS; TRANSPORT PROPERTIES;

INTERFACIAL IMPERFECTIONS;

TUNNEL JUNCTIONS;

EID: 0036464907     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-8853(01)00729-6     Document Type: Article

References (6)