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Volumn 240, Issue 1-3, 2002, Pages 156-158
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Role of the interfacial state: A comparison of Co/Al2O3/NiFe and La0.7Ca0.3MnO3/Al2O3/La 0.7Ca0.3MnO3 tunnel junctions
a
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Author keywords
Magnetoresistance; Thin films and magnetic oxides; Tunneling
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Indexed keywords
INTERFACES (MATERIALS);
MAGNETIC VARIABLES MEASUREMENT;
MAGNETORESISTANCE;
SURFACE PROPERTIES;
THIN FILMS;
TRANSPORT PROPERTIES;
X RAY ANALYSIS;
TUNNELING MAGNETORESISTANCE (TMR);
TUNNEL JUNCTIONS;
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EID: 0036464813
PISSN: 03048853
EISSN: None
Source Type: Journal
DOI: 10.1016/S0304-8853(01)00770-3 Document Type: Article |
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Times cited : (3)
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References (8)
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