Calculable field generation using TEM cells applied to the calibration of a novel E-field probe

IEEE Transactions on Electromagnetic Compatibility

Volumn 44, Issue 1, 2002, Pages 59-71

  Kärst, Jens Peter ^b   Groh, Christine ^a,b   Garbe, Heyno ^a,b  

^a IEEE

^b LEIBNIZ UNIVERSITY HANNOVER   (Germany)

Author keywords

Circular coaxial calibration cell; Generalized telegraphist's equations; Probe calibration; Short dipole; TEM waveguides; Vector field measurement

Indexed keywords

BANDWIDTH; EIGENVALUES AND EIGENFUNCTIONS; ELECTROMAGNETIC WAVE POLARIZATION; ELECTROMAGNETIC WAVE PROPAGATION; PROBES; VECTORS; WAVEGUIDES;

ELECROMAGNETIC FIELD GENERATION;

ELECTROMAGNETIC FIELD MEASUREMENT;

EID: 0036464627     PISSN: 00189375     EISSN: None     Source Type: Journal    
DOI: 10.1109/15.990711     Document Type: Article

References (18)

1. TEM waveguides for EMC measurements
2. Alternatives to open area test sites
3. The new national standard of EM field strength; Realization and dissemination
4. Portable E-field strength meter system and its traceable calibration up to 1 GHz using a μTEM cell
5. Generation of standard EM fields using TEM transmission cells
6. A new family of TEM cells with enlarged bandwidth and optimized working volume
7. Conversion of Maxwell's equations into generalized telegraphist's equations
8. Generalized telegraphist's equation for waveguides of varying cross-section
9. Field mode properties of loaded TEM waveguides
10. Waveguide tapers transitions and couplers
11. Methodology for electromagnetic interference measurements
12. Standard probes for electromagnetic field measurements
13. Analytical numerical techniques for analyzing an electrically short dipole with a nonlinear load
14. Novel probes and evaluation procedures to assess field magnitude and polarization