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Surface Review and Letters

Volumn 9, Issue 1, 2002, Pages 141-146

Alignment of Ar+ ions produced after resonant Auger decay of Ar* 2p5 3d Resonances

(5) Meyer, M a,b Marquette, A a,b Grum Grzhimailo, A a,c Flesch, R d Ruhl E d

a UNIVERSITÉ PARIS SACLAY (France)

b CE Saclay (France)

c MOSCOW STATE UNIVERSITY (Russian Federation)

d UNIVERSITY OF OSNABRÜCK (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON;

AUGER ELECTRON SPECTROSCOPY; CONFERENCE PAPER; FLUORESCENCE SPECTROSCOPY; NUCLEAR PHYSICS; POLARIZATION; SPECTRAL SENSITIVITY; SYNCHROTRON RADIATION; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0036463230 PISSN: 0218625X EISSN: None Source Type: Journal
DOI: 10.1142/S0218625X02002063 Document Type: Conference Paper

Times cited : (4)

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