TOF-SIMS and XPS-investigations of ion implanted single crystal 1b-diamonds

Analytical and Bioanalytical Chemistry

Volumn 374, Issue 4, 2002, Pages 614-618

  Schlett, V ^a   Fladung, T ^a   Dieckhoff, S ^a   Stock, R ^b  

^a FRAUNHOFER INSTITUTE FOR MANUFACTURING TECHNOLOGY AND ADVANCED MATERIALS IFAM   (Germany)

^b UNIVERSITY OF BREMEN   (Germany)

Author keywords

1b diamond; Cutting tools; Ion implantation; TOF SIMS; XPS

Indexed keywords

COMPUTER SIMULATION; DIAMONDS; OPTICAL MICROSCOPY;

SINGLE CRYSTAL DIAMONDS;

SINGLE CRYSTALS;

CHROMIUM; DIAMOND; ELEMENT; ION; TITANIUM;

CALIBRATION; CONFERENCE PAPER; CRYSTAL; IMPLANTATION; MASS SPECTROMETRY; MICROSCOPY; SIMULATION;

EID: 0036460629     PISSN: 16182642     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00216-002-1539-9     Document Type: Conference Paper

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8. Stock HR, Kohlscheen J, Mayr P (2001) 11 Tagung Festkörper-analytik. Chemnitz, Germany