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Analytical and Bioanalytical Chemistry

Volumn 374, Issue 4, 2002, Pages 588-591

Diffusion studies in non-oxide ceramics: Analytical aspects of the use of ion implanted stable tracers and sims

(6) Schmidt, Harald a Fielitz, P a Borchardt, G a Weber, S b Scherrer, H b Baumann, H c

a CLAUSTHAL UNIVERSITY OF TECHNOLOGY (Germany)

b INSTITUT JEAN LAMOUR (France)

c GOETHE UNIVERSITY (Germany)

Author keywords

Diffusion; Ion implantation; Secondary ion mass spectrometry

Indexed keywords

DIFFUSION; ION IMPLANTATION; RADIOACTIVE TRACERS; SECONDARY ION MASS SPECTROMETRY; TRANSITION METALS;

TEMPERATURE DEPENDENCE;

CERAMIC MATERIALS;

BORON; CARBON; ION; METAL; NITROGEN; SILICON; TITANIUM; TRACER;

CERAMICS; CONFERENCE PAPER; DIFFUSION; IMPLANTATION; MASS SPECTROMETRY; PHYSICAL CHEMISTRY; PRECURSOR; TEMPERATURE DEPENDENCE; CHEMISTRY; METHODOLOGY; REVIEW; TEMPERATURE;

CERAMICS; DIFFUSION; RADIOACTIVE TRACERS; SPECTROMETRY, MASS, SECONDARY ION; TEMPERATURE;

EID: 0036460340 PISSN: 16182642 EISSN: None Source Type: Journal
DOI: 10.1007/s00216-002-1536-z Document Type: Conference Paper

Times cited : (4)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.