Study of the structure of passivated vanadium-titanium alloys and their semiconductor properties

Analytical and Bioanalytical Chemistry

Volumn 374, Issue 4, 2002, Pages 715-719

  Bachmann, T ^a   Vonau, W ^a   John, P ^b  

^a KURT SCHWABE INSTITUT FÜR MESS UND SENSORTECHNIK E V MEINSBERG   (Germany)

^b M K JUCHHEIM GmbH and Co   (Germany)

Author keywords

Hydrogen peroxide sensor; Passivity; Photocurrent behavior; Semiconductor properties; Vanadium titanium alloy

Indexed keywords

CORROSION; METALLIC FILMS; PHOTOCURRENTS; SEMICONDUCTOR MATERIALS;

ELECTRODE POTENTIAL;

VANADIUM ALLOYS;

METAL; OXIDE; OXYGEN; TITANIUM; TITANIUM DIOXIDE; VANADIUM;

CHEMICAL STRUCTURE; CONFERENCE PAPER; ELECTRIC CONDUCTIVITY; ELECTRIC CURRENT; ELECTRIC POTENTIAL; ELECTROCHEMICAL ANALYSIS; FILM; MATERIAL STATE; MEASUREMENT; SEMICONDUCTOR; X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 0036460064     PISSN: 16182642     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00216-002-1317-8     Document Type: Conference Paper

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