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Volumn 374, Issue 4, 2002, Pages 703-708
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Potential of cathodoluminescence (cl) microscopy and spectroscopy for the analysis of minerals and materials
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Author keywords
Cathodoluminescence; Materials; Microscopy; Minerals; Spectroscopy
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Indexed keywords
CATHODOLUMINESCENCE;
MICROSCOPIC EXAMINATION;
MINERALS;
POINT DEFECTS;
SPECTROSCOPIC ANALYSIS;
TRACE ELEMENTS;
LATTICE DEFECTS;
CHEMICAL ANALYSIS;
ALUMINUM;
CHROMIUM;
COPPER;
CRYSTALLIN;
ION;
IRON;
LEAD;
MANGANESE;
MINERAL;
TIN;
TRACE ELEMENT;
ANALYTIC METHOD;
CATHODE LUMINESCENCE;
CHEMICAL ANALYSIS;
CHEMICAL BOND;
CONFERENCE PAPER;
DIFFUSION;
ELECTRON;
MASS SPECTROMETRY;
MATERIAL STATE;
MEASUREMENT;
MICROSCOPY;
SCANNING ELECTRON MICROSCOPY;
SOLID;
SPECTROSCOPY;
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EID: 0036460056
PISSN: 16182642
EISSN: None
Source Type: Journal
DOI: 10.1007/s00216-002-1461-1 Document Type: Conference Paper |
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Times cited : (67)
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References (13)
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