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Volumn , Issue , 2002, Pages 915-918

Mechanical bend fatigue reliability of lead-free PBGA assemblies

Author keywords

Bend fatigue; Lead free; Reliability

Indexed keywords

BENDING (DEFORMATION); FATIGUE OF MATERIALS; RELIABILITY; TIN ALLOYS;

EID: 0036459787     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (11)
  • 3
    • 0003455833 scopus 로고    scopus 로고
    • Lead free solder project final report
    • Lead Free Solder Project Final Report, NCMS Report 0401RE96, August 1997.
    • (1997) NEMS Report 0401RR96
  • 4
    • 0034838075 scopus 로고    scopus 로고
    • Thermal fatigue properties of lead-free solders on Cu and NiP under bump metallurgies
    • May
    • Charles Zhang, Jong-Kai Lin, and Li Li, "Thermal Fatigue Properties of Lead-free Solders on Cu and NiP Under Bump Metallurgies", IEEE-ECTC, May 2001.
    • (2001) IEEE-ECTC
    • Zhang, C.1    Lin, J.-K.2    Li, L.3
  • 5
    • 0004302552 scopus 로고    scopus 로고
    • Motorola Semiconductor Technical Data, Document No. AN1231/D
    • Andrew Mawer, Plastic Ball Grid Array, Motorola Semiconductor Technical Data, Document No. AN1231/D.
    • Plastic Ball Grid Array
    • Mawer, A.1
  • 6
    • 0032661646 scopus 로고    scopus 로고
    • Mechanical cycling fatigue of PBGA package interconnects
    • Andrew Skipor and Larry Leicht, "Mechanical Cycling Fatigue of PBGA Package Interconnects," Int'l J. of Microcircuits and Electronic Packaging, Vol. 22, No. 1, pp. 43-48, 1999.
    • (1999) Int'l J. of Microcircuits and Electronic Packaging , vol.22 , Issue.1 , pp. 43-48
    • Skipor, A.1    Leicht, L.2
  • 9
    • 0003225504 scopus 로고
    • Reliability, lifetime prediction and accelerated testing of prospective alternatives to lead based solders
    • Hareesh Mavoori and Jason Chin, "Reliability, Lifetime Prediction and Accelerated Testing of Prospective Alternatives to Lead Based Solders", IEEE Transactions, 1995.
    • (1995) IEEE Transactions
    • Mavoori, H.1    Chin, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.