Determining the optimum process mean for a poor process

International Journal of Advanced Manufacturing Technology

Volumn 20, Issue 10, 2002, Pages 754-757

  Chen, C H ^a   Chou, C Y ^b   Huang, K W ^a  

^a SOUTHERN TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b NATIONAL YUNLIN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

Author keywords

Autocorrelated process; Process mean; Process standard deviation; Quality loss funtion; Specification limits; Target value

Indexed keywords

MATHEMATICAL MODELS; OPTIMIZATION; PROCESS CONTROL; QUALITY CONTROL; QUALITY FUNCTION DEPLOYMENT;

QUALITY LOSS FUNCTION;

PROCESS ENGINEERING;

EID: 0036459127     PISSN: 02683768     EISSN: None     Source Type: Journal    
DOI: 10.1007/s001700200234     Document Type: Article

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