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Volumn 720, Issue , 2002, Pages 15-22

Reliability and stability of novel tunable thin film

Author keywords

[No Author keywords available]

Indexed keywords

MICROWAVE DEVICES; PHASE SHIFTERS; SEMICONDUCTOR DIODES; THERMAL EFFECTS; VARACTORS;

EID: 0036458564     PISSN: 02729172     EISSN: None     Source Type: Journal    
DOI: 10.1557/proc-720-h2.2     Document Type: Article
Times cited : (6)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.