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Volumn 720, Issue , 2002, Pages 15-22
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Reliability and stability of novel tunable thin film
a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
MICROWAVE DEVICES;
PHASE SHIFTERS;
SEMICONDUCTOR DIODES;
THERMAL EFFECTS;
VARACTORS;
TUNABLE THIN FILM;
THIN FILMS;
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EID: 0036458564
PISSN: 02729172
EISSN: None
Source Type: Journal
DOI: 10.1557/proc-720-h2.2 Document Type: Article |
Times cited : (6)
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References (9)
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