Measurements of stress distribution in top coat and TGO layers processed by EB-PVD

Ceramic Engineering and Science Proceedings

Volumn 23, Issue 4, 2002, Pages 391-396

  Tomimatsu, Toru ^a   Zhu, Shijie ^a   Kagawa, Yutaka ^a  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; GROWTH (MATERIALS); MECHANICAL VARIABLES MEASUREMENT; OXIDES; PHYSICAL VAPOR DEPOSITION; RESIDUAL STRESSES; STRESS CONCENTRATION;

ELECTRON BEAM PHYSICAL VAPOR DEPOSITED THERMAL BARRIER COATINGS; ISOTHERMAL HEAT EXPOSURE; THERMALLY GROWN OXIDE;

THERMAL INSULATING MATERIALS;

EID: 0036458148     PISSN: 01966219     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

1. M. J. Stiger, N. M. Yanar, M. J. Topping, F. S. Pettit, and G. Meier, Z. Metallkd., 90 [12] 1069-1078 (1999).
2. S. M. Meier, D. K. Gupta, J. Eng. Gas. Tur., 116, 250-257 (1994).
3. J. A. Thompson and T. W. Cline, Acta Mater., 49, 1565-1575 (2001).
4. D. J. Wortman, E. C. Duderstadt, W. A. Nelson, J. Eng. Gas. Tur., 112, 527-529 (1990).
5. E. A. G. Shillington, and D. R. Clarke, Acta Mater., 47, 1297-1305 (1999).
6. D. R. Mumm, A. G. Evans, and I. T. Spitsberg, Acta Mater., 49, 2329-2340 (2001).
7. P. Bouvier, G. Lucazeau, J. Phys. Chem. Solids., 61, 569-578 (2000).
8. H. Kakisawa, S. Kawazoe and Y. Kagawa, Seisan-Kenkyu., 52, 33-36 (2000).
9. H. Hough, J. Demas, T. O. Williams and H. N. G. Wadley, Acta Mater., 43, 821-834 (1995).