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Volumn 722, Issue , 2002, Pages
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Materials and devices for optoelectronics and microphotonics
[No Author Info available]
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM NITRIDE;
ATOMIC FORCE MICROSCOPY;
BAND STRUCTURE;
DISLOCATIONS (CRYSTALS);
ELECTRIC LIGHTING;
ELECTROMAGNETIC WAVE EMISSION;
ETCHING;
GALLIUM NITRIDE;
LIGHT EMITTING DIODES;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
MOLECULAR BEAM EPITAXY;
PHOTOLUMINESCENCE;
SEMICONDUCTOR GROWTH;
SEMICONDUCTOR QUANTUM WELLS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
EIREV;
EPILAYERS;
EXCITATION LASERS;
FORWARD BIAS;
ORGANIC LIGHT EMITTING DIODES (OLED);
RECONDENSATION;
TEMPLATES;
WAVELENGTHS;
WET CHEMICAL ETCHING;
X-RAY TOPOGRAPHY;
SEMICONDUCTOR MATERIALS;
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EID: 0036456651
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Review |
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Times cited : (2)
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References (0)
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