Microfields induced by random compensated charge pairs in Ferroelectric Materials

Materials Research Society Symposium - Proceedings

Volumn 720, Issue , 2002, Pages 131-142

  Crowne, Frank J ^a   Tidrow, Steven C ^a   Potrepka, Daniel M ^a   Tauber, Arthur ^b  

^a U S ARMY RESEARCH LABORATORY   (United States)

^b GeoCenters Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE; ELECTRIC CHARGE; ELECTRIC FIELD EFFECTS; FERROELECTRICITY; IONIZATION; LATTICE CONSTANTS; PERMITTIVITY;

HOLTSMARK DISTRIBUTION;

FERROELECTRIC MATERIALS;

EID: 0036454415     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1557/proc-720-h5.1     Document Type: Conference Paper

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