Subthreshold voltage-induced transferred charge measurements of evaporated ZnS:Mn alternating-current thin-film electroluminescent devices

Journal of the Society for Information Display

Volumn 10, Issue 3 SPEC., 2002, Pages 271-281

  Cleary, B A ^a   Keir, P D ^a   Hitt, J C ^a   Plant, T K ^a   Wager, J F ^a   Aitchison, B ^b   Tuenge, R T ^b   Sun, S S ^b  

^a Oregon State University   (United States)

^b Planar America   (United States)

Author keywords

Electro optic characterization; Electroluminescence; ZnS

Indexed keywords

CHARACTERIZATION; CHARGE TRANSFER; ELECTRIC CHARGE MEASUREMENT; ELECTRON TRAPS; ELECTRONIC DENSITY OF STATES; ELECTROOPTICAL EFFECTS; EPITAXIAL GROWTH; EVAPORATION; LIGHT POLARIZATION; THIN FILM DEVICES; ZINC SULFIDE;

ATOMIC LAYER EPITAXY; BIPOLAR VOLTAGE PUSLES; ELECTROOPTIC CHARACTERIZATION; PHOTODEPOLARIZATION; SUBTHRESHOLD VOLTAGE-INDUCED TRANSFERRED CHARGE MEASUREMENT;

LUMINESCENT DEVICES;

EID: 0036454083     PISSN: 10710922     EISSN: None     Source Type: Journal    
DOI: 10.1889/1.1827879     Document Type: Article

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