Tailored particle distributions derived from MIL-STD-1246

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4774, Issue , 2002, Pages 79-98

  Peterson, Ronald V ^a   Magallanes, Philip G ^a   Rock, David F ^a  

^a RAYTHEON COMPANY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ENVIRONMENTAL IMPACT; OPTICAL SYSTEMS; SPACE APPLICATIONS; STANDARDS;

PARTICLE DISTRIBUTIONS; RAYTHEON ELECTRONIC SYSTEMS;

PARTICLE OPTICS;

EID: 0036453482     PISSN: 0277786X     EISSN: None     Source Type: Journal    
DOI: 10.1117/12.481665     Document Type: Article

References (10)

1. MIL-STD-1246A, Product Cleanliness Levels and Contamination Control Program, 18 August 1967.
2. MIL-STD-1246B, Product Cleanliness Levels and Contamination Control Program, 4 September 1987.
3. MIL-STD-1246C, Product Cleanliness Levels and Contamination Control Program, 11 April 1994.
4. IEST-STD-CC1246D, Product Cleanliness Levels and Contamination Control Program, Institute of Environmental Sciences and Technology, 2002.
5. Hamberg, O. and E. M. Shon, "Particle Size Distributions on Surfaces in Clean Rooms", Aerospace Corporation Report SD-TR-84-34, 30 April 1984.
6. Buch, J. D. and M. K. Barsh, "Analysis of Particulate contamination Buildup on Surfaces", SPIE Vol. 777 Optical System Contamination: Effects, Measurement, Control (1987).
7. Raab, J. H., "Particulate Contamination Effects on Solar Cell Performance", Martin Marietta Aerospace Report MCR-86-2005, January, 1986
8. Ma, P.T., M. C. Fong, and A. L. Lee, "Surface Particle Obscuration and BRDF Predictions", SPIE Vol. 1165, Scatter from Optical Components (1989).
9. Cooper, D. W., "Comparing Three Environmental Particle Size Distributions: Power Law (FED_STD_209D), Lognormal, Approximate Lognormal (MIL-STD-1246B)", Journal of the IES 34, No. 1 (1991).
10. Barengoltz, J., "Calculating the Obscuration Ratio Due to Particle Surface Contamination