Thruster plume induced contamination measurements from the PIC and SPIFEX flight experiments

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 4774, Issue , 2002, Pages 199-209

  Soares, Carlos ^a   Barsamian, Hagop ^a   Rauer, Scott ^b  

^a BOEING COMPANY   (United States)

^b NASA JOHNSON SPACE CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONTAMINATION; FLIGHT SIMULATORS; MOLECULAR SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SPACECRAFT PROPULSION; X RAY SPECTROSCOPY;

INTERNATIONAL SPACE STATION; PLUME IMPINGEMENT CONTAMINATION; QUARTZ CRYSTAL MICROBALANCES; REMOTE MANIPULATOR SYSTEM; SHUTTLE PLUME IMPINGEMENT FLIGHT EXPERIMENT; THRUSTER PLUME INDUCED CONTAMINATION; X RAY PHOTOSPECTROSCOPY;

OPTICAL VARIABLES MEASUREMENT;

EID: 0036448048     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.481653     Document Type: Conference Paper

References (5)

1. Koontz, S.L., Melendez, O., Zolensky, M., Soares, C.: "SPIFEX Contamination Studies," Engineering Directorate, Manufacturing, Materials, and Process Technology Division, NASA JSC-27399, May 1996.
2. Koontz, S., Soares, C.: "DTO-829 (STS-74): The Plume Impingement Contamination (PIC) Space Flight Experiment," Engineering Directorate, Manufacturing, Materials, and Process Technology Division, NASA JSC-27614, October 1996.
3. Orr, W.C.: "PIC Camera Lens SEM Test Analysis," Lockheed Martin deliverable, August 16, 2000.
4. Soares, C.E.: "Phase I Report: Provisional Plume Contamination Model," SSCN 2208 Technical Definition (Phase I), The Boeing Company, 1999.
5. Soares, C.E., Mikatarian, R.R., Barsamian, H.R., Rauer, S.J.: "International Space Station Bipropellant Plume Contamination Model," AIAA 2002-3016, June 2002.