Low temperature characterization and modeling of IGBTS

PESC Record - IEEE Annual Power Electronics Specialists Conference

Volumn 3, Issue , 2002, Pages 1277-1282

  Kang, X ^a   Caiafa, A ^a   Santi, E ^a   Hudgins, J ^a   Palmer, P R ^b  

^a University of South Carolina   (United States)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC BREAKDOWN; FINITE DIFFERENCE METHOD; SEMICONDUCTOR DEVICE MODELS; TEMPERATURE;

DEVICE CIRCUIT INTERACTION; TURN OFF SWITCHING;

INSULATED GATE BIPOLAR TRANSISTORS;

EID: 0036446791     PISSN: 02759306     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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