IC mixed-signal BIST: Separating facts from fiction

IEEE International Test Conference (TC)

Volumn , Issue , 2002, Pages 1205-

  Sunter, Stephen K ^a  

^a LogicVision Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TEST EQUIPMENT; MIXED SIGNAL BUILT-IN SELF TEST; ON-CHIP ANALYSIS; ON-CHIP GENERATION; POWER REGULATORS;

AMPLIFIERS (ELECTRONIC); ANALOG TO DIGITAL CONVERSION; AUTOMATIC TESTING; BUILT-IN SELF TEST; DIGITAL FILTERS; DIGITAL SIGNAL PROCESSING; DIGITAL TO ANALOG CONVERSION; LOGIC DEVICES; MICROPROCESSOR CHIPS; MIXER CIRCUITS; POWER ELECTRONICS;

INTEGRATED CIRCUIT TESTING;

EID: 0036444553     PISSN: None     EISSN: None     Source Type: Journal    
DOI: 10.1109/TEST.2002.1041911     Document Type: Article

References (4)

1. M.J.Ohletz, "Hybrid Built In Self Test (HBIST) for Mixed Analog/Digital Integrated Circuits", ETC, 1991
2. A.Roy et al, "High Accuracy Ramp Generation for A/D Converter BIST", ITC, 2002
3. S.Sunter & A.Roy, "BIST for Phase-Locked Loops in Digital Applications", ITC, 1999
4. M.Hafed & G.Roberts, "Test and Evaluation of Multiple Embedded Mixed-signal Test Cores", ITC, 2002