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Volumn 3, Issue , 2002, Pages 1810-1815

CF4 decomposition of flue gas from semiconductor process using inductively coupled plasma

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL REACTORS; CHEMICAL VAPOR DEPOSITION; DECOMPOSITION; FLUOROCARBONS; GLOBAL WARMING; INDUCTIVELY COUPLED PLASMA; SEMICONDUCTOR DEVICE MANUFACTURE; STOICHIOMETRY;

EID: 0036443220     PISSN: 01972618     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (4)

References (12)
  • 1
    • 0344322420 scopus 로고    scopus 로고
    • Activities of PFCs emission reduction by EIAJ CVD & Dry Etching working group
    • in Japanese
    • Y. Matsushita, "Activities of PFCs emission reduction by EIAJ CVD & Dry Etching working group," Oyo Buturi, Vol. 69, No. 03, p.0305-0309 (2000) (in Japanese).
    • (2000) Oyo Buturi , vol.69 , Issue.3 , pp. 0305-0309
    • Matsushita, Y.1
  • 6
    • 0003235962 scopus 로고    scopus 로고
    • Pulsed corona flue gas treatment
    • London, ON, Canada
    • M. Ingram and E. Goldman, "Pulsed corona flue gas treatment," presented at the Pan Am AOT Workshop, London, ON, Canada, 1998.
    • (1998) Pan Am AOT Workshop
    • Ingram, M.1    Goldman, E.2
  • 7
    • 0033350279 scopus 로고    scopus 로고
    • Comparison of reactor performance in the nonthermal plasma chemical processing of hazardous air pollutants
    • S. Futamura, H. Einaga and A. Zhang, "Comparison of reactor performance in the nonthermal plasma chemical processing of hazardous air pollutants," Proc. of 1999 IEEE-IAS Annual Meeting, 1999, pp. 1105-1111.
    • (1999) Proc. of 1999 IEEE-IAS Annual Meeting , pp. 1105-1111
    • Futamura, S.1    Einaga, H.2    Zhang, A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.